Laboratoire de Physique et Chimie des Nano-objets
Institut National des Sciences Appliquées
135 avenue de Rangueil, 31077 TOULOUSE CEDEX 4 - FRANCE
Tél : 00 33 05 61 55 96 45 | Fax : (+33) (0)5 61 55 96 97
135 avenue de Rangueil, 31077 TOULOUSE CEDEX 4 - FRANCE
Tél : 00 33 05 61 55 96 45 | Fax : (+33) (0)5 61 55 96 97
Accueil du site > LPCNO > Publications > Articles > 2001 > Conducting tip atomic force microscopy analysis of aluminium oxide barrier defects decorated by electrodeposition
J. Carrey, K. Bouzehouane, J.-M. George, C. Ceneray, A. Fert, A. Vaurès, S. Kenane and L. Piraux
Conducting tip atomic force microscopy analysis of aluminium oxide barrier defects decorated by electrodeposition
Appl. Phys. Lett., 79 (19), 3158 (2001)
Dans la même rubrique :
- Spin redistribution due to Pauli blocking in quantum dots
- Spin relaxation quenching in semiconductor quantum dots
- Synthesis and Magnetic Properties of Nickel Nanorods
- Transition from droplet growth to percolation : Monte-Carlo simulations and an analytical model
- Growth of Au clusters on amorphous Al2O3 : evidence of cluster mobility above a critical size
- Growth of Au clusters on amorphous Al2O3 : are small clusters more mobile than atoms ?
- The generic nature of the Smart-Cut® process for thin film transfer
- H-T magnetic phase diagrams of electron doped Cax Sm1-x Mn O3 : evidence for phase separation and field induced transitions
- Room temperature, charge and orbital ordering,and phase coexistence in Bi1/2Sr1/2MnO3.
- Low temperature charge and magnetic order of Bi1/2Sr1/2MnO3.
- Magnetic and magnetotransport properties of GdBaCo2O5+ : a high magnetic field study.
