Laboratoire de Physique et Chimie des Nano-objets

Institut National des Sciences Appliquées
135 avenue de Rangueil, 31077 TOULOUSE CEDEX 4 - FRANCE
Tél : 00 33 05 61 55 96 45 | Fax : (+33) (0)5 61 55 96 97

Partenaires

CNRS
INSA


Choose your site's language


          Version Française           English Version

Search

On this website



Home page > LPCNO > Publications > Articles > 2008 > KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

C. Dumas, L. Ressier and J. Grisolia, A. Arbouet, V. Paillard, G. BenAssayag and C. Bonafos, P. Normand

KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

Microelectronic Engineering, 85, 2358-2361 (2008)