Laboratoire de Physique et Chimie des Nano-objets

Institut National des Sciences Appliquées
135 avenue de Rangueil, 31077 TOULOUSE CEDEX 4 - FRANCE
Tél : 00 33 05 61 55 96 45 | Fax : (+33) (0)5 61 55 96 97

Partenaires

CNRS
INSA


Choisir la langue du site


          Version Française           English Version

Rechercher

Sur ce site



Accueil du site > LPCNO > Séminaires > 2016 > Nanoscale characterization at HERMES beamline

Nanoscale characterization at HERMES beamline

Date : 29/09/2016 à 14:00

Titre : Nanoscale characterization at HERMES beamline

Intervenant : Sufal Swaraj

Provenance : Synchrotron SOLEIL

Salle : Salle 217 - LPCNO

Résumé : HERMES is an undulator beamline with an energy range of 70 to 2500 eV. The beamline is a dual branch beamline equipped with two complimentary microscopy techniques, STXM (Scanning Transmission X-ray Microscopy) and X-PEEM (X-ray PhotoEmitted Electron Microscopy). In this talk I will present this beamline and the two microscopes with the aid of some recently performed measurements. I will follow this by highlighting the utility of soft x-ray based characterization of polymeric materials used in organic solar cell devices. One of the challenges in the field of all-organic bulk heterojunction solar cell devices is the characterization of nanostructures formed by the donor and acceptor phases. I will illustrate how a multi-method approach using soft x-ray based techniques, such as STXM, resonant soft x-ray scattering and reflectivity can be used to disentangle surface, bulk, interfacial and molecular orientation information of these polymeric materials.